DPI (Direct Power Injection) Immunity Testing System

Immunity Testing System DPI (Direct Power Injection) Immunity Testing System

The DPI(Direct Power Injection) immunity test method is an immunity evaluation method for semiconductors (IC) standardized by IEC standards.
This test evaluates immunity by directly injecting RF interference power into the IC power supply on the test board on which the IC to be evaluated is mounted.
In the test, it is necessary to gradually increase the test level (power) for each test frequency and check the performance of the IC each time.
In addition, when a malfunction occurs, it is necessary to record the status of the malfunction, which takes a lot of time and effort.
The NoiseKen's DPI immunity test system performs tests from the start of the test to malfunction determination consistently. This is a revolutionary automation system that saves test time and testers' hands.

* DPI：Direct Power Injection

Immunity Testing System

Features

Features
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- Compliant with IEC 62132-4 (DPI method).
- Automatic judgment of IC performance criteria conforming to IEC 62132-1 (Class A/C/D1/D2/E) .
- Enables IC malfunction judgment with flexible combination up to ten judgment conditions (eight types of automatic measuring judgments + one mask test judgment + one serial decode judgment).
- Applicable to power ON/OFF by multiple DC power source control to reset IC when a malfunction occurs.
- Enables voltage value and reset time setting in accordance with EUT (IC)
- Reduces the test time greatly with the multi-sweep function.
- Capable of both TEM-Cell method (IEC 62132-2) and IC Stripline method (IEC 62132-8) testing.

Software

Enables IC malfunction judgment with up to ten judgment conditions (eight automatic measurement judgments + one mask test judgment + one serial decode judgment)

■ Setting Items for Automatic Judgment

Item	Description
Judgment	Select whether to use.
Type	Up to eight types of automatic measuring judgment designation (A to H) among total of thirty six types measured values.
	(p-p, max, min, amplitude, period, frequency, duty cycle, rise time, fall time, phase, etc. [total thirty six types])
Source	Select a source channel. (CH1, CH2, CH3, CH4)
Judgment method	Select the judgment method. (a + b / -c, a + d% /-e%)
Reference value (a)	Enter a value to be used as a criterion.
Upper limit value (b, d)	Enter the upper limit value.
Lower Limit Value (c, e)	Enter the lower limit.

There are a total of Twenty five items that can display in the result data. (frequency, test level, traveling wave power, reflected power, effective power, keyboard, comments, power reflection coefficient, voltage reflection coefficient, standing wave ratio, load impedance (L), load impedance (H), effective voltage (L), effective voltage (H), fail mode, automatic measurement judgment (eight types), mask test judgment, serial decode judgment)

IEC 62132-4 Automatic Measurement Flowchart

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This system can automatically perform all measurements from the start of the test to the malfunction judgment.
* “Class B” judgment not applicable.
The Multi-Sweep Function

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This product has a function called “multi-sweep mode” to reduce measurement time. When the multi-sweep mode is set to 3 steps, measurement is repeated up to 3 times at 1 frequency. However, if there is no malfunction up to the test end level, it will proceed to the next frequency without repeating. By setting a large step value in step 1 (1st step), a small step value in step 2 (2nd step), and a smaller step value in step 3 (3rd step), this saves time compared to measuring from the start level to the end level with a fixed step value. The figure on the right shows the image of operation when the multi-sweep mode is set to 2 steps. (outline) If a malfunction occurs in step 1, go to step 2 after judging the malfunction class. The start level of step 2 is the same as the test level of the previous OK judgment. If a malfunction occurs in step 2, the malfunction class is judged and then switches to the next frequency.